What we have learned about fighting defects

Shull, F., Basili, V., Boehm, B., Brown, A.W., Costa, P., Lindvall, M., Port, D., Rus, I., Tesoriero, R., Zelkowitz, M.: What we have learned about fighting defects. In: VIII International Symposium on Software Metrics - METRICS’02, Washington, DC, USA, IEEE Computer Society (June 2002) 249–258, DOI 10.1109/METRIC.2002.1011343.